Publicaciones en colaboración con investigadores/as de Dresden University of Technology (4)

2018

  1. Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layers

    Ultramicroscopy, Vol. 195, pp. 47-52

2016

  1. Energy-Filtered Backscattered Imaging Using Low-Voltage Scanning Electron Microscopy: Characterizing Blends of ZnPc–C60 for Organic Solar Cells

    Advanced Engineering Materials, Vol. 18, Núm. 6, pp. 913-917

  2. Non-destructive imaging of organosilicate glass (OSG) thin films at low voltage with the EsB detector

    IEEE Transactions on Device and Materials Reliability, Vol. 16, Núm. 4, pp. 461-464

  3. Optimization of the SEM Working Conditions: EsB Detector at Low Voltage

    Advanced Engineering Materials, Vol. 18, Núm. 2, pp. 185-193